Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures /
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Main Authors: | |
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Corporate Authors: | ; ; |
Group Author: | |
Published: |
U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O.,
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Publisher Address: | Washington, D.C. : |
Publication Dates: | 1981. |
Literature type: | Book |
Language: | English |
Series: |
Semiconductor measurement technology
NBS special publication ; 400-65 |
Subjects: | |
Item Description: |
"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards." Issued March 1981." S/N 003-003-02297-7. |
Carrier Form: | iv, 49 pages : illustrations ; 27 cm. |
Bibliography: | Includes bibliographical references. |
Index Number: | QC100 |
CLC: | TN4 |
Call Number: | TN4/M682 |