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Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures /

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Bibliographic Details
Main Authors: Mitchell, Michael A
Corporate Authors: United States. National Bureau of Standards; Air Force Wright Aeronautical Laboratories; Center for Electronics and Electrical Engineering U.S
Group Author: Linholm, Loren W
Published: U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O.,
Publisher Address: Washington, D.C. :
Publication Dates: 1981.
Literature type: Book
Language: English
Series: Semiconductor measurement technology
NBS special publication ; 400-65
Subjects:
Integrated circuits > Testing
Electronic apparatus and appliances > Testing
Item Description: "Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
Issued March 1981."
S/N 003-003-02297-7.
Carrier Form: iv, 49 pages : illustrations ; 27 cm.
Bibliography: Includes bibliographical references.
Index Number: QC100
CLC: TN4
Call Number: TN4/M682

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