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Refractometry：16-20 May 1994, Warsaw, Poland

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Bibliographic Details
Corporate Authors: Institute of Applied Optics Poland; Society of Photo-Optical Instrumentation Engineers; Komitet Badaan Naukowych Poland; Society of Photo-optical Instrumentation Engineers. Poland Chapter
Group Author: Szyjer Mariusz; Pluta Maksymilian
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c1995.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 2208
Subjects:
Refraction, Double
Refraction
Carrier Form: xxii, 228 p.: ill. ; 28 cm.
ISBN: 0819417068 (pbk.)
Index Number: O435
CLC: O435.1-532
Call Number: O435.1-532/R332/1994
Contents: Includes bibliographical references and index.

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