Spectroscopic characterization techniques for semiconductor technology III:14-15 March 1988, Newport Beach, California

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Bibliographic Details
Corporate Authors: Optical Society of America; Society of Photo-Optical Instrumentation Engineers; Metallurgical Society U.S
Group Author: Glembocki O. J; Pollak Fred H; Ponce Fernando
Published: The Society,
Publisher Address: Bellingham, Wash., U.S.A.
Publication Dates: c1988.
Literature type: Book
Language: English
Series: Proceedings of SPIE--the International Society for Optical Engineering ; v. 946
Subjects:
Carrier Form: viii, 234 p.: ill. ; 28 cm.
ISBN: 0892529814
Index Number: TN3
CLC: TN3-532
Call Number: TN3-53/S741/1988
Contents: Includes bibliographies and index.