Scanning microscopies 2013 : advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April - 1 May 2013, Baltimore, Maryland, United States /

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Bibliographic Details
Corporate Authors: SPIE Society
Group Author: Postek, Michael T
Published:
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 8729
Subjects:
Carrier Form: 1 v. (various pagings) : ill. ; 28 cm.
Bibliography: Includes bibliographical references and author index.
ISBN: 9780819495204 (pbk.) :
0819495204 (pbk.)
CLC: TN16-532
Call Number: TN16-532/S283-3/2013