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The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems：proceedings, October 27-29, 1993, Venice, Italy

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Bibliographic Details
Corporate Authors: IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems (1993 Venice
Group Author: Lombardi F
Published: IEEE Computer Society Press,
Publisher Address: Los Alamitos, Calif.
Publication Dates: c1993.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses
Fault-tolerant computing > Congresses
Carrier Form: xiii, 336 p.: ill. ; 24 cm.
ISBN: 0818635029 (case)
Index Number: TP302
CLC: TP302.8-532
Call Number: TP302.8-532/I59/1993/

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