Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography : 19-22 July 1992, San Diego, California /

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Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers
Group Author: Hoover, Richard B; Walker, A. B. C
Published:
Literature type: Book
Language: English
Series: SPIE proceeding series ; v. 1742
Subjects:
Carrier Form: 702 p. : ill. ; 28 cm.
Bibliography: Includes bibliographical references and index.
ISBN: 0819409154 (pbk.)
9780819409157 (pbk.) :
Index Number: QB88
CLC: P172-532
Call Number: P172-532/M961/1992
Contents: AXAF grazing incidence mirrors -- Grazing incidence optics : theory and high throughput optics -- Multilayer mirror fabrication and characterization -- X-ray/EUV filters, gratings, and polarizers -- X-ray telescopes and observatories -- Multilayer optics for x-ray projection lithography -- Poster session.