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Author: Wilson, David Woodburn,,1917

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Twenty Second Annual IEEE Semiconductor Thermal Measurement and Management Symposium：SEMI-THERM proceedings 2006 : Dallas, TX, USA, March 14-16, 2006

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Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium (22nd 2006 Dallas, TX; National Institute of Standards and Technology U.S; IEEE Xplore Online service; Components, Packaging & Manufacturing Technology Society
Published: IEEE,
Publisher Address: Piscataway, N.J.
Publication Dates: c2006.
Literature type: Book
Language: English
Subjects:
Semiconductors > Cooling
Semiconductors > Thermal properties
Carrier Form: x, 239 p.: ill. ; 28 cm.
ISBN: 1424401534
9781424401536
Index Number: TN3
CLC: TN3-532
TN307-532
Call Number: TN3-532/I59/2006
Contents: Cover title.
"IEEE Catalog Number 06CH37767 Softbound Edition ; 06CH377667C CD-ROM Edition"
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Includes bibliographical references.

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