Cover is for reference only

Damage to VUV, EUV, and X-ray optics：18-19 April 2007, Prague, Czech Republic

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers; SPIE Europe
Group Author: Sobierajski Ryszard H; Wabnitz Hubertus; Juha L
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c2007.
Literature type: Book
Language: English
Series: Proceedings of SPIE ; v. 6586
Subjects:
X-ray optics
Far ultra violet radiaiton
Carrier Form: 1 v. (various pagings): ill. ; 28 cm.
ISBN: 9780819467140
0819467146
Index Number: O434
CLC: O434-532
Call Number: O434-532/D154/2007
Contents: Includes bibliographical references and index.

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