Machine vision applications in industrial inspection VIII:24-26 January 2000, San Jose, California

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers; IS & T--the Society for Imaging Science and Technology
Group Author: Tobin Kenneth W
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c2000.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 3966
Subjects:
Carrier Form: ix, 396 p.: ill. ; 28 cm.
ISBN: 0819435848
Index Number: TP274
CLC: TP274-532
TB4-532
Call Number: TB4-532/M149/2000
Contents: Includes bibliographical references and index.