Modern characterization of electromagnetic systems and its associated metrology /
"This book describes new method of characterization of electromagnetic wave dynamics and measurement, which are based on modern computational and digital signal processing techniques. The book introduces modern computational concepts in electromagnetic
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Main Authors: | |
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Group Author: | ; ; |
Published: |
John Wiley & Sons, Inc.,
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Publisher Address: | Hoboken, NJ : |
Publication Dates: | 2021. |
Literature type: | Book |
Language: | English |
Subjects: | |
Summary: |
"This book describes new method of characterization of electromagnetic wave dynamics and measurement, which are based on modern computational and digital signal processing techniques. The book introduces modern computational concepts in electromagnetic |
Carrier Form: | xxviii, 692 pages : illustrations (some color) ; 24 cm |
Bibliography: | Includes bibliographical references and index. |
ISBN: |
9781119076469 1119076463 |
Index Number: | QC760 |
CLC: | O441-32 |
Call Number: | O441-32/S245 |