Screen LibraryReliability and degradation：semiconductor devices and circuits
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| Group Author: | ; |
|---|---|
| Published: |
J. Wiley,
|
| Publisher Address: | Chichester New York |
| Publication Dates: | c1981. |
| Literature type: | Book |
| Language: | English |
| Series: |
The Wiley series in solid state devices and circuits |
| Subjects: | |
| Carrier Form: | xii, 444 p.: ill. ; 24 cm. |
| ISBN: | 0471280283 |
| Index Number: | TN306 |
| CLC: | TN306 |
| Call Number: | TN306/R382/ |
| Contents: | Includes bibliographical references and index. |