Reliability and degradation:semiconductor devices and circuits
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Group Author: | ; |
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Published: |
J. Wiley,
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Publisher Address: | Chichester New York |
Publication Dates: | c1981. |
Literature type: | Book |
Language: | English |
Series: |
The Wiley series in solid state devices and circuits |
Subjects: | |
Carrier Form: | xii, 444 p.: ill. ; 24 cm. |
ISBN: | 0471280283 |
Index Number: | TN306 |
CLC: | TN306 |
Call Number: | TN306/R382/ |
Contents: | Includes bibliographical references and index. |