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Surveillance and assessment technologies for law enforcement：19-20 November, 1996, Boston, Massachusetts

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Bibliographic Details
Corporate Authors: National Institute of Justice; Society of Photo-Optical Instrumentation Engineers; National Institute of Standards and Technology U.S
Group Author: Yeager Suzan; Ortiz Steve; DePersia A. Trent
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c1997.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 2935
Subjects:
Electronics in criminal investigation > Congresses
Forensic sciences > Congresses
Law enforcement > Technological innovations > Congresses
Carrier Form: v, 190 p.: ill. ; 28 cm.
ISBN: 0819423378
Index Number: D918
CLC: D918-39
Call Number: D918-39/S963/1996/
Contents: Includes bibliographic references and author index.

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