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Cover is for reference only
X射线探伤检验技术
Saved in:
Bibliographic Details
Main Authors:
李瑞棠
(李瑞棠编)
Published:
烃加工出版社
Publisher Address:
北京
Publication Dates:
1985
Literature type:
Book
Language:
Chinese
Subjects:
X射线探测--无损检验
>
技术
无损检验--X射线探测
>
技术
Carrier Form:
176页: ; 19cm
Index Number:
TG115
CLC:
TG115.28
Call Number:
TG115.28/4419
Subscription Summary
上海图书馆提供最近两年现报现刊的开架阅览服务,装订后的过报过刊合订本进入淮海路馆基藏书库后提供闭架调阅服务。由于从下架到入库会有较⻓的周期,读者可以通过专业服务⻔户(
https://z.library.sh.cn
)利用电子期刊查找所需文献。
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