Atom-probe field ion microscopy and its applications

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Bibliographic Details
Main Authors: Sakurai Toshio
Group Author: Sakai A; Pickering H.W
Published: Academic Press,
Publisher Address: Boston
Publication Dates: c1989.
Literature type: Book
Language: English
Series: Advances in electronics and electron physics.Supplement ; 20
Subjects:
Carrier Form: vii, 299 p.: ill. ; 24 cm.
ISBN: 0120145820
Index Number: TH742
CLC: TH742
Call Number: TH742/S159/