Charged semiconductor defects:structure, thermodynamics and diffusion
Saved in:
Main Authors: | |
---|---|
Corporate Authors: | |
Group Author: | |
Published: |
Springer,
|
Publisher Address: | London |
Publication Dates: | c2009. |
Literature type: | Book |
Language: | English |
Series: |
Engineering materials and processes |
Subjects: | |
Online Access: |
http://dx.doi.org/10.1007/978-1-84882-059-3 |
Carrier Form: | xiv, 294 p.: ill., plans ; 24 cm. |
ISBN: |
9781848820593 (electronic bk.) 1848820593 (electronic bk.) |
Index Number: | O474 |
CLC: | O474 |
Contents: | Includes bibliographical references and index. |