Charged semiconductor defects:structure, thermodynamics and diffusion

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Bibliographic Details
Main Authors: Seebauer Edmund Gerard.
Corporate Authors: SpringerLink (Online service)
Group Author: Kratzer Meredith C.
Published: Springer,
Publisher Address: London
Publication Dates: c2009.
Literature type: Book
Language: English
Series: Engineering materials and processes
Subjects:
Online Access: http://dx.doi.org/10.1007/978-1-84882-059-3
Carrier Form: xiv, 294 p.: ill., plans ; 24 cm.
ISBN: 9781848820593 (electronic bk.)
1848820593 (electronic bk.)
Index Number: O474
CLC: O474
Contents: Includes bibliographical references and index.