Optical measurement systems for industrial inspection IV:13-17 June 2005, Munich, Germany
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Corporate Authors: | ; ; |
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Group Author: | ; ; ; |
Published: |
SPIE,
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Publisher Address: | Bellingham, Wash. |
Publication Dates: | c2005. |
Literature type: | Book |
Language: | English |
Series: |
Proceedings of SPIE ; v. 5856 |
Subjects: | |
Carrier Form: | 2 v. (xviii, 1048 p.): ill. ; 28 cm. |
ISBN: | 0819458562 |
Index Number: | TP274 |
CLC: |
TP274-532 TB133-532 TH74-532 |
Call Number: | TH74-532/O62.1/2005/v.1 |
Contents: | Includes bibliographical references and author index. |