Semiconductor material and device characterization /
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Main Authors: | |
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Corporate Authors: | |
Published: |
IEEE Press ; John Wiley & Sons,
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Publisher Address: | [Piscataway, NJ] : Hoboken, N.J. : |
Publication Dates: | 2006. |
Literature type: | eBook |
Language: | English |
Edition: | Third edition. |
Subjects: | |
Online Access: |
https://onlinelibrary.wiley.com/book/10.1002/0471749095 |
Item Description: |
Description based on print version record. "Wiley-Interscience." |
Carrier Form: |
1 online resource (xv, 779 pages) : illustrations Also available in print. |
Bibliography: | Includes bibliographical references and index. |
ISBN: |
9780471749097 (electronic bk.) 9780471739067 (acid-free paper) 0471739065 (acid-free paper) |
Index Number: | QC611 |
CLC: | TN304 |