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Semiconductor material and device characterization /

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Bibliographic Details
Main Authors: Schroder, Dieter K.
Corporate Authors: Wiley Online Library (Online service)
Published: IEEE Press ; John Wiley & Sons,
Publisher Address: [Piscataway, NJ] : Hoboken, N.J. :
Publication Dates: 2006.
Literature type: eBook
Language: English
Edition: Third edition.
Subjects:
Semiconductors.
Semiconductors > Testing.
Electronic books.
Online Access: https://onlinelibrary.wiley.com/book/10.1002/0471749095
Item Description: Description based on print version record.
"Wiley-Interscience."
Carrier Form: 1 online resource (xv, 779 pages) : illustrations
Also available in print.
Bibliography: Includes bibliographical references and index.
ISBN: 9780471749097 (electronic bk.)
9780471739067 (acid-free paper)
0471739065 (acid-free paper)
Index Number: QC611
CLC: TN304

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