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ISTFA '95：the 21st International Symposium for Testing and Failure Analysis, 6-10 November 1995, Santa Clara Convention, Santa Clara, California

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Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis (21st 1995 Santa Clara, Calif; ASM International. Electronic Materials and Processing Division
Published: ASM International,
Publisher Address: Materials Park, Ohio
Publication Dates: 1995.
Literature type: Book
Language: English
Subjects:
Electronic apparatus and appliances > Testing > Congresses
Electronics > Materials > Testing > Congresses
Carrier Form: xiii, 367 p.: ill. ; 29 cm.
ISBN: 0871705540
Index Number: TN06
CLC: TN06-532
Call Number: TN06-532/I61/1995/
Contents: Includes bibliographical references.

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