Screen Library表面分析(XPS和AES)引论 = An Introduction to Surface Analysis By XPS and AES
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| Main Authors: | ; |
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| Group Author: | |
| Published: |
华东理工大学出版社
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| Publisher Address: | 上海 |
| Publication Dates: | 2008 |
| Literature type: | Book |
| Language: | Chinese |
| Series: |
当代材料学与工程译丛 |
| Subjects: | |
| Carrier Form: | 144页: ; 24cm |
| ISBN: | 978-7-5628-2226-4 |
| Index Number: | O655 |
| CLC: | O655.9 |
| Call Number: | O655.9/3141 |
| Contents: | 本书讲述了现代电子能谱中的单色化XPS、小面积XPS（SAXPS)、成像XPS、XPS深度剖析、场发射AES/SAM等功能的分析技术、以及在冶金、腐蚀、陶瓷、催化剂、微电子半导体材料等领域中的应用。 |