1966 IEEE International convention record : at the IEEE international convention, New York, N. Y., March 21-25, 1966. Part 10, Instruments; measurements; industrial electronics; nuclear scie ultrasonics.

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Bibliographic Details
Corporate Authors: Institute of Electrical and Electronics Engineers
Published:
Literature type: Book
Language: English
Subjects:
Carrier Form: 191 p. : ill. ; 26 cm
CLC: TN1-532
Call Number: TN1-532/I59-4/1966/pt.10