1966 IEEE International convention record : at the IEEE international convention, New York, N. Y., March 21-25, 1966. Part 10, Instruments; measurements; industrial electronics; nuclear scie ultrasonics.
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Literature type: | Book |
Language: | English |
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Carrier Form: | 191 p. : ill. ; 26 cm |
CLC: | TN1-532 |
Call Number: | TN1-532/I59-4/1966/pt.10 |