X-ray fluorescence and diffraction application notes. Volume 1 /
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Corporate Authors: | |
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Published: |
Siemens,
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Publisher Address: | Iselin, N.J. : |
Publication Dates: | 1973. |
Literature type: | Book |
Language: | English |
Subjects: | |
Item Description: |
Cover title. "Siemens X-Ray analytical application notes, nos. 1-25." |
Carrier Form: | 1 volume (various pagings) : illustrations ; 28 cm |
Index Number: | RC78 |
CLC: | O72 |
Call Number: | O72/X1/v.1 |