Introduction to scanning tunneling microscopy /
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic...
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Main Authors: | |
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Published: |
Oxford University Press,
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Publisher Address: | Oxford, United Kingdom : |
Publication Dates: | 2021. |
Literature type: | Book |
Language: | English |
Edition: | Third edition. |
Series: |
Monographs on the physics and chemistry of materials ;
69 |
Subjects: | |
Summary: |
The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. This is a reference book on the topic. |
Carrier Form: | xxxvii, 452 pages, 32 unnumbered pages of plates : illustrations, forms ; 24 cm. |
Bibliography: | Includes bibliographical references (pages [429]-447) and index. |
ISBN: |
9780198856559 0198856555 |
Index Number: | QH212 |
CLC: | TN16 |
Call Number: | TN16/C518/3rd ed. |
Contents: | Tunneling phenomenon -- Tunneling matrix elements -- Atomic forces -- Atomic forces and tunneling -- Nanometer-scale imaging -- Atomic-scale imaging -- Imaging wavefunctions -- Nanomechanical effects -- Piezoelectric scanner -- Vibration isolation -- Electronics and control -- Mechanical design -- Tip treatment -- Scanning tunneling spectroscopy -- Atomic force microscopy. |