Introduction to scanning tunneling microscopy /

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic...

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Bibliographic Details
Main Authors: Chen, C. Julian.
Published: Oxford University Press,
Publisher Address: Oxford, United Kingdom :
Publication Dates: 2021.
Literature type: Book
Language: English
Edition: Third edition.
Series: Monographs on the physics and chemistry of materials ; 69
Subjects:
Summary: The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. This is a reference book on the topic.
Carrier Form: xxxvii, 452 pages, 32 unnumbered pages of plates : illustrations, forms ; 24 cm.
Bibliography: Includes bibliographical references (pages [429]-447) and index.
ISBN: 9780198856559
0198856555
Index Number: QH212
CLC: TN16
Call Number: TN16/C518/3rd ed.
Contents: Tunneling phenomenon -- Tunneling matrix elements -- Atomic forces -- Atomic forces and tunneling -- Nanometer-scale imaging -- Atomic-scale imaging -- Imaging wavefunctions -- Nanomechanical effects -- Piezoelectric scanner -- Vibration isolation -- Electronics and control -- Mechanical design -- Tip treatment -- Scanning tunneling spectroscopy -- Atomic force microscopy.