Characterization and behavior of materials with submicron dimensions:proceedings from the conference

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Bibliographic Details
Group Author: Waber James T
Published: World Scientific Publishing Co.,
Publisher Address: Singapore
Publication Dates: c1985.
Literature type: Book
Language: English
Carrier Form: xii, 205 p.: ill. ; 22 cm.
ISBN: 9971500426
Index Number: TN303
CLC: TN303-53