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Reliability physics, 1972 : 10th annual proceedings, Las Vegas, Nevada, April 5-7, 1972 /

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Bibliographic Details
Corporate Authors: International Reliability Physics Symposium Las Vegas, Nev; Institute of Electrical and Electronics Engineers. Electron Devices Group; IEEE Reliability Group
Published:
Literature type: Book
Language: English
Subjects:
Electronic apparatus and appliances > Reliability > Congresses
Electronic apparatus and appliances > Testing > Congresses
Item Description: IEEE catalog no. 72CH0628-8-PHY.
Carrier Form: viii, 219 p. : ill. ; 28 cm.
Index Number: TK7870
CLC: TM93-532
Call Number: TM93-532/R382/1972

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