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Opto-Ireland 2002：optical metrology, imaging, and machine vision : 5-6 September 2002, Galway, Ireland

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Bibliographic Details
Corporate Authors: Enterprise Ireland; Opto-Ireland 2002 (2002 Galway, Ireland); Irish Machine Vision and Image Processing Conference; Society of Photo-Optical Instrumentation Engineers
Group Author: Shearer Andrew
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c2003.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 4877
Subjects:
Optical measurements
Image processing
Computer vision
Carrier Form: vii, 282 p.: ill. ; 28 cm.
ISBN: 0819446580
Index Number: TH74
CLC: TH74-532
TP334-532
Call Number: TP334-532/O629/2002
Contents: Includes bibliographical references and index.

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