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Optical fabrication, testing, and metrology II：13-15 September 2005, Jena, Germany

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Bibliographic Details
Corporate Authors: SPIE Europe; Friedrich-Schiller-Universit··at Jena; European Optical Society; Deutsche Gesellschaft f··ur Angewandte Optik; Optonet Organization; Society of Photo-Optical Instrumentation Engineers
Group Author: Geyl Roland; Wang Lingli; Duparrae Angela
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c2005.
Literature type: Book
Language: English
Series: Proceedings of SPIE ; v. 5965
Subjects:
Optical instruments > Testing
Optical materials
Metrology
Optical instruments > Design and construction
Carrier Form: 1 v. (various pagings): ill. ; 28 cm.
ISBN: 0819459836
Index Number: O435
CLC: O435.2-532
TH74-532
Call Number: TH74-532/O626-2/2005
Contents: Includes bibliographical references and author index.

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