Screen LibraryScanning probe microscopy of soft matter : fundamentals and practices.
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a widerange of soft materials. I...
Saved in:
| Main Authors: | |
|---|---|
| Group Author: | |
| Published: |
Wiley,
|
| Publisher Address: | Weinheim : |
| Publication Dates: | 2011. |
| Literature type: | eBook |
| Language: | English |
| Subjects: | |
| Online Access: |
http://onlinelibrary.wiley.com/book/10.1002/9783527639953 |
| Summary: |
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a widerange of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopyin soft matter research. From the contents:> |
| Item Description: | 5.6 Unfolding of Macromolecules. |
| Carrier Form: | 1 online resource (xix, 664 pages) : illustrations |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: |
9783527639953 (electronic bk.) 3527639950 (electronic bk.) 9783527639977 (electronic bk.) 3527639977 (electronic bk.) 9781283869812 (MyiLibrary) 1283869810 (MyiLibrary) 9783527639960 3527639969 9783527639984 3527639985 |
| Index Number: | QH212 |
| CLC: | TN16 |
| Contents: |
Scanning Probe Microscopy of Soft Matter: Fundamentals and Practices; Contents; Preface; Part One: Microscopy Fundamentals; 1 Introduction; References; 2 Scanning Probe Microscopy Basics; 2.1 Basic Principles of Scanning Probe Microscopy; 2.2 Scanning Tunneling Microscopy; 2.3 Advent of Atomic Force Microscopy; 2.4 Overview of Instrumentation; 2.4.1 Scanners; 2.4.2 Microcantilevers as Force Sensors; 2.4.3 Electronic Feedback; 2.5 Probes and Cantilevers in Scanning Probe Microscopy; 2.5.1 Physical Attributes of Microcantilevers; 2.5.2 Tip Characterization; 2.5.3 Tip Modification. 2.6 Modes of Operation2.6.1 Contact Mode; 2.6.2 Noncontact Mode and Tapping Mode; 2.7 Advantages and Limitations; References; 3 Basics of Atomic Force Microscopy Studies of Soft Matter; 3.1 Physical Principles: Forces of Interaction; 3.1.1 Long-Range Forces; 3.1.2 Short-Range Forces; 3.1.3 Other Forces of Interaction; 3.1.4 Resolution Criteria; 3.1.5 Scan Rates and Resonances; 3.2 Imaging in Controlled Environment; 3.2.1 AFM Imaging in Liquid; 3.2.2 AFM at Controlled Temperature; 3.2.3 Imaging in Controlled Humidity; 3.3 Artifacts in AFM Imaging of Soft Materials. 3.3.1 Surface Damage and Deformation3.3.2 Tip Dilation; 3.3.3 Damaged and Contaminated Tip or Surface; 3.3.4 Noises and Vibrations; 3.3.5 Tip Artifacts; 3.3.6 Thermal Drift and Piezoelement Creep; 3.3.7 Oscillations and Artificial Periodicities; 3.3.8 Image Processing Artifacts; 3.4 Some Suggestions and Hints for Avoiding Artifacts; 3.4.1 Tip Testing and Deconvolution; 3.4.2 Force Control; 3.4.3 Tip Contamination and Cleaning; References; 4 Advanced Imaging Modes; 4.1 Surface Force Spectroscopy; 4.1.1 Introduction to Force Spectroscopy; 4.1.2 Force-Distance Curves; 4.1.3 Force Mapping Mode. 4.2 Friction Force Microscopy4.3 Shear Modulation Force Microscopy; 4.4 Chemical Force Microscopy (CFM); 4.5 Pulsed Force Microscopy; 4.6 Colloidal Probe Microscopy; 4.7 Scanning Thermal Microscopy; 4.7.1 Thermal Resistive Probes and Spatial Resolution; 4.7.2 Localized Thermal Analysis; 4.7.3 Thermal Conductivity; 4.8 Kelvin Probe and Electrostatic Force Microscopy; 4.9 Conductive Force Microscopy; 4.10 Magnetic Force Microscopy; 4.11 Scanning Acoustic Force Microscopy; 4.11.1 Force Modulation; 4.11.2 Ultrasonic Force Microscopy; 4.12 High-Speed Scanning Probe Microscopy; References. Part Two: Probing Nanoscale Physical and Chemical Properties5 Mechanical Properties of Polymers and Macromolecules; 5.1 Elements of Contact Mechanics and Elastic Modulus; 5.1.1 General SFS Nanoprobing Principles; 5.1.2 Substrate Effects; 5.1.3 Issues and Key Assumptions with Nanomechanical Probing; 5.2 Probing of Elastic Moduli for Different Materials: Selected Examples; 5.2.1 Bulk Materials and Blends; 5.2.2 Ultrathin Polymer Films from Different Polymers; 5.2.3 Probing Individual Macromolecules; 5.3 Adhesion Measurements; 5.4 Viscoelasticity Measurements; 5.5 Friction. |