Microstructural characterization of materials

Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for...

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Bibliographic Details
Main Authors: Brandon, D. G.
Corporate Authors: Wiley InterScience (Online service)
Group Author: Kaplan, Wayne D.
Published:
Literature type: Electronic eBook
Language: English
Edition: 2nd ed.
Series: Quantitative software engineering series
Subjects:
Online Access: http://onlinelibrary.wiley.com/book/10.1002/9780470727133
Summary: Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this p.
Carrier Form: 1 online resource.
Bibliography: Includes bibliographical references and index.
ISBN: 9780470727133
0470727136
9780470027844
0470027843
9780470727126 (electronic bk.)
0470727128 (electronic bk.)
Index Number: TA417
CLC: TB302
Contents: Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 2 Diffraction Analysis of Crystal Structure; 3 Optical Microscopy; 4 Transmission Electron Microscopy; 5 Scanning Electron Microscopy; 6 Microanalysis in Electron Microscopy; 7 Scanning Probe Microscopy and Related Techniques; 8 Chemical Analysis of Surface Composition; 9 Quantitative and Tomographic Analysis of Microstructure; Appendices; Index.