Microstructural characterization of materials
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for...
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Literature type: | Electronic eBook |
Language: | English |
Edition: | 2nd ed. |
Series: |
Quantitative software engineering series
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Online Access: |
http://onlinelibrary.wiley.com/book/10.1002/9780470727133 |
Summary: |
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this p. |
Carrier Form: | 1 online resource. |
Bibliography: | Includes bibliographical references and index. |
ISBN: |
9780470727133 0470727136 9780470027844 0470027843 9780470727126 (electronic bk.) 0470727128 (electronic bk.) |
Index Number: | TA417 |
CLC: | TB302 |
Contents: | Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 2 Diffraction Analysis of Crystal Structure; 3 Optical Microscopy; 4 Transmission Electron Microscopy; 5 Scanning Electron Microscopy; 6 Microanalysis in Electron Microscopy; 7 Scanning Probe Microscopy and Related Techniques; 8 Chemical Analysis of Surface Composition; 9 Quantitative and Tomographic Analysis of Microstructure; Appendices; Index. |