Screen LibraryInfrared imaging systems：design, analysis, modeling, and testing : 16-18 April 1990, Orlando, Florida
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| Corporate Authors: | ; ; |
|---|---|
| Group Author: | |
| Published: |
The Society,
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| Publisher Address: | Bellingham, Wash., USA |
| Publication Dates: | c1990. |
| Literature type: | Book |
| Language: | English |
| Series: |
Proceedings / SPIE--the International Society for Optical Engineering ; v. 1309 |
| Subjects: | |
| Carrier Form: | vii, 313 p.: ill. ; 28 cm. |
| ISBN: | 0819403601 |
| Index Number: | TN21 |
| CLC: | TN21-532 |
| Call Number: | TN21-53/I43.16/1990/ |
| Contents: |
"Part of two-conference program on Electro-Optic Analysis and Testing held at the SPIE Technical Symposium on Optical Engineering and Photonics in Aerospace Sensing, 16-20 April 1990, in Orlando, Florida." Includes bibliographical references and index. |