Lightmetry 2002:metrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland

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Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers. Poland Chapter.; Institute of Applied Optics (Poland); Komitet Badań Naukowych (Poland); Society of Photo-Optical Instrumentation Engineers
Group Author: Szyjer Mariusz.; Powichrowska Ewa.; Pluta Maksymilian.
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c2003.
Literature type: Book
Language: English
Series: SPIE Poland Chapter proceedings ; 68
Subjects:
Carrier Form: xx, 338 p.: ill. ; 28 cm.
ISBN: 0819448702
Index Number: TH744
CLC: TH744.2-532
O436.3-532
O432.2-532
Call Number: O432.2-532/L724/2002
Contents: Previous conference entitled: Lightmetry : metrology, spectroscopy, and testing techniques using light.
Includes bibliographical references and author index.