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Scanning tunneling microscopy/spectroscopy and related techniques：12th International Conference STM'03, Eindhoven, The Netherlands, 21-25 July 2003 : [proceedings]

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Bibliographic Details
Corporate Authors: International Conference on Scanning Tunneling Microscopy/Spectroscopyand Related Techniques (12th 2003 Eindhoven, Netherlands); Cobra (Association). Inter-University Research Istitute on Communication Technology.; Nederlandse Organisatie voor Wetenschappelijk Onderzoek.; Stichting voor Fundamenteel Onderzoek der Materie.; Technische Universiteit Eindhoven.
Group Author: (Paul M.); Kemerink M.; (Martijn); Koenraad P. M.
Published: American Institute of Physics,
Publisher Address: Melville, N.Y.
Publication Dates: 2003.
Literature type: Book
Language: English
Series: AIP conference proceedings ; v. 696
Subjects:
Tunneling spectroscopy.
Scanning probe microscopy.
Nanotechnology.
Scanning tunneling microscopy.
Carrier Form: xviii, 179, A1-A7 p.: ill. ; 24 cm. +1 CD-ROM (4 3/4 in.)
Publication Frequency: Also available via the World Wide Web.
ISBN: 0735401683 (cloth)
Index Number: TN16
CLC: TN16-532
TH742-532
Call Number: TH742-532/I613/2003
Contents: Secondary subtitle "Proceedings" from cover.
Includes bibliographical references and index.

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