Cover is for reference only

2002 IEEE International Integrated Reliability Workshop：final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002

Saved in:
Bibliographic Details
Corporate Authors: IEEE International Integrated Reliability Workshop (2002 Lake Tahoe, Calif; IEEE Electron Devices Society; IEEE Reliability Society
Published: IEEE Society,
Publisher Address: Piscataway, N.J.
Publication Dates: c2002.
Literature type: Book
Language: English
Subjects:
Integrated circuits > Reliability
Integrated circuits > Wafer-scale integration > Reliability
Carrier Form: v, 214 p.: ill. ; 28 cm.
Publication Frequency: Also available via the World Wide Web.
ISBN: 0780375580
Index Number: TN06
CLC: TN06-532
TN406-532
Call Number: TN406-532/I61/2002
Contents: "IEEE Catalog No. 02TH8634"--verso of T.p.
Includes bibliographical references.

Related Book Recommendations