Screen Library2005 IEEE International Reliability Physics Symposium proceedings：43rd annual : San Jose, California, April 17-21, 2005
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| Corporate Authors: | ; ; |
|---|---|
| Published: |
Institute of Electrical and Electronics Engineers,
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| Publisher Address: | Piscataway, NJ |
| Publication Dates: | c2005. |
| Literature type: | Book |
| Language: | English |
| Subjects: | |
| Carrier Form: | xii, 764 p.: ill. ; 28 cm. |
| Publication Frequency: | Also issued online with additional title: Reliability Physics Symposium, 2005, proceedings, 43rd Annual, 2005 IEEE International. |
| ISBN: | 0780388038 (pbk.) |
| Index Number: | TB114 |
| CLC: |
TB114.3-532 TN306-532 TN406-532 |
| Call Number: | TN306-532/R382/2005 |
| Contents: | Includes bibliographical references. |