Screen LibraryX-ray diffraction and ellipsometric studies of zinc sulfide thin films grown by atomic layer epitaxy
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| Main Authors: | |
|---|---|
| Published: |
Finnish Academy of Technology,
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| Publisher Address: | Helsinki |
| Publication Dates: | 1988. |
| Literature type: | Book |
| Language: | English |
| Series: |
Acta polytechnica Scandinavica.Applied physics series, 0355-2721 ; no. 161 |
| Subjects: | |
| Carrier Form: | 46 p.: ill. ; 15 cm. |
| ISBN: | 9516662641 |
| Index Number: | O484 |
| CLC: | O484.4-533 |
| Call Number: | O484.4-533/O391 |
| Contents: | Includes bibliographical references (p. 43-46). |