2019 International Conference on Optical Instruments and Technology. Optoelectronic measurement technology and systems : 26-28 October 2019, Beijing, China /

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Bibliographic Details
Corporate Authors: International Conference on Optical Instruments and Technology Beijing, China; Zhongguo yi qi yi biao xue hui; SPIE Society
Group Author: Han, Sen; Zhu, Jigui, 1970; Xu, Kexin, 1956; Xiao, Hai, Dr
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2020]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 11439
Subjects:
Carrier Form: 1 volume (various pagings) : illustrations ; 28 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510636569
CLC: TH74-532
Call Number: TH74-532/I613-7/2019