Soft X-ray and EUV imaging systems:3-4 August 2000, San Diego, USA

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Stulen R. H; Kaiser Winfried M
Published: SPIE,
Publisher Address: Bellingham, Wash., USA
Publication Dates: c2000.
Literature type: Book
Language: English
Series: SPIE proceedings series ; v. 4146
Subjects:
Carrier Form: vii, 178 p.: ill. ; 28 cm.
ISBN: 0819437913
Index Number: O434
CLC: O434-532
Call Number: O434-532/S681/2000
Contents: Includes bibliographical references and index.