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Thinning methodologies for pattern recognition

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Bibliographic Details
Group Author: Suen Ching Y.; Wang Patrick S-P.; (Patrick Shen-pei)
Published: World Scientific,
Publisher Address: Singapore River Edge, NJ
Publication Dates: c1994.
Literature type: Book
Language: English
Series: Series in machine perception and artificial intelligence ; vol. 8
Subjects:
Image processing > Digital techniques.
Optical pattern recognition.
Pattern recognition systems.
Parallel processing (Electronic computers)
Algorithms.
Carrier Form: 344 p.: ill. ; 26 cm.
ISBN: 9810214820
Index Number: O235
CLC: O235
Call Number: O235/T443/
Contents: Includes bibliographical references.

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