Screen LibraryNoise in devices and circuits：2-4 June, 2003, Santa Fe, New Mexico, USA
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| Corporate Authors: | ; |
|---|---|
| Group Author: | ; ; |
| Published: |
SPIE,
|
| Publisher Address: | Bellingham, Wash. |
| Publication Dates: | c2003. |
| Literature type: | Book |
| Language: | English |
| Series: |
Proceedings / SPIE--the International Society for Optical Engineering ; v. 5113 |
| Subjects: | |
| Carrier Form: | xxi, 516 p.: ill. ; 28 cm. |
| ISBN: | 0819449733 |
| Index Number: | TN03 |
| CLC: | TN03-532 |
| Call Number: | TN03-532/N784/2003 |
| Contents: | Includes bibliographical references and author index. |