Screen LibraryOn-wafer microwave measurements and de-embedding /
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| Main Authors: | |
|---|---|
| Published: |
Artech House,
|
| Publisher Address: | Boston : |
| Publication Dates: | [2016] |
| Literature type: | Book |
| Language: | English |
| Series: |
Artech house microwave library
|
| Subjects: | |
| Carrier Form: | xxvii, 216 pages : illustrations ; 24 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: |
9781630810566 (hardback) : 1630810568 (hardback) |
| Index Number: | TK7876 |
| CLC: | TN454 |
| Call Number: | TN454/L892 |
| Contents: | Introduction -- Measurement equipment -- Network analyzer basics and calibration -- Silicon-integrated passive devices -- On-wafer de-embedding methods -- Experimental device characterization in CMOS -- A recipe for successful on-wafer characterization -- Appendix A: Network theory and device metrics -- Appendix B: Even- and odd-mode analysis -- Appendix C: MATLAB code. |