On-wafer microwave measurements and de-embedding /
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Main Authors: | |
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Published: |
Artech House,
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Publisher Address: | Boston : |
Publication Dates: | [2016] |
Literature type: | Book |
Language: | English |
Series: |
Artech house microwave library
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Subjects: | |
Carrier Form: | xxvii, 216 pages : illustrations ; 24 cm. |
Bibliography: | Includes bibliographical references and index. |
ISBN: |
9781630810566 (hardback) : 1630810568 (hardback) |
Index Number: | TK7876 |
CLC: | TN454 |
Call Number: | TN454/L892 |
Contents: | Introduction -- Measurement equipment -- Network analyzer basics and calibration -- Silicon-integrated passive devices -- On-wafer de-embedding methods -- Experimental device characterization in CMOS -- A recipe for successful on-wafer characterization -- Appendix A: Network theory and device metrics -- Appendix B: Even- and odd-mode analysis -- Appendix C: MATLAB code. |