Dimensional optical metrology and inspection for practical applications VI : 13 April 2017, Anaheim, California, United States /
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Corporate Authors: | ; |
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Group Author: | ; |
Published: |
SPIE,
|
Publisher Address: | Bellingham, Washington : |
Publication Dates: | [2017] |
Literature type: | Book |
Language: | English |
Series: |
Proceedings of SPIE,
volume 10220 |
Subjects: | |
Item Description: | "SPIE.defense+ commercial sensing"--Cover. |
Carrier Form: | 1 volume (various pagings) : illustrations, forms ; 28 cm. |
Bibliography: | Includes bibliographical references. |
ISBN: |
9781510609419 (paperback) : 1510609415 (paperback) |
CLC: | TB96-532 |
Call Number: | TB96-532/D582/2017 |