Applied logistic regression

Saved in:
Bibliographic Details
Main Authors: Hosmer David W., Jr
Group Author: Lemeshow Stanley
Published: Wiley,
Publisher Address: New York
Publication Dates: c1989.
Literature type: Book
Language: English
Series: Wiley series in probability and mathematical statistics.Applied probability and statistics section
Subjects:
Carrier Form: ix, 307 p.: ill. ; 23 cm.
ISBN: 0471615536
Index Number: O212
CLC: O212.1
Contents: "A Wiley-Interscience publication."