SPIE Future Sensing Technologies 2023 : 18-20 April 2023, Yokohama, Japan /

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Bibliographic Details
Corporate Authors: SPIE Future Sensing Technologies (Conference) Yokohama, Japan); SPIE (Society)
Group Author: Matoba, Osamu (Editor); Shaw, Joseph A. (Editor); Valenta, Christopher R. (Editor)
Published: SPIE,
Publisher Address: Bellingham, Washington :
Publication Dates: [2023]
Literature type: Book
Language: English
Series: Proceedings of SPIE, volume 12327
Subjects:
Item Description: "At SPIE Future Sensing Technologies" -- Cover.
Carrier Form: 1 volume (various pagings) : illustrations, forms ; 27 cm.
Bibliography: Includes bibliographical references.
ISBN: 9781510657229
CLC: TP212-532
Call Number: TP212-532/S678/2023