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Noise and information in nanoelectronics, sensors, and standards III：24-26 May, 2005, Austin, Texas, USA

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Bibliographic Details
Corporate Authors: Society of Photo-Optical Instrumentation Engineers
Group Author: Bergou Jaanos A
Published: SPIE,
Publisher Address: Bellingham, Wash.
Publication Dates: c2005.
Literature type: Book
Language: English
Series: Proceedings of SPIE ; v. 5846
Subjects:
Noise control
Nanotechnology
Information technology
Detectors
Noise
Carrier Form: xxiv, 210 p.: ill. ; 28 cm.
ISBN: 0819458414
Index Number: TB5
CLC: TB5-532
TB383-532
Call Number: TB5-532/N784/2005
Contents: Includes bibliographical references and index.

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