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Architecture design for soft errors

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Bibliographic Details
Main Authors: Mukherjee Shubu.
Published: Morgan Kaufmann Publishers/Elsevier,
Publisher Address: Amsterdam Boston
Publication Dates: c2008.
Literature type: Book
Language: English
Subjects:
Integrated circuits
Integrated circuits > Effect of radiation on.
Computer architecture.
System design
Systèmes informatiques > Fiabilité.
Ordinateurs > Fiabilité
Logiciels > Évaluation.
Circuits intégrés, Effets du rayonnement sur les.
Logiciels > Fiabilité
Circuits intégrés > Tolérance aux fautes.
Tolérance aux fautes (Informatique)
Carrier Form: xxi, 337 p.: ill. ; 25 cm.
ISBN: 0123695295
9780123695291
Index Number: TN430
CLC: TN430.3
TN430.2
TP302.7
TP306
Call Number: TN430.2/M953
Contents: Includes bibliographical references and index.
Device- and circuit-level modeling, measurement, and mitigation -- Architectural vulnerability analysis -- Advanced architectural vulnerability analysis -- Error coding techniques -- Fault detection via redundant execution -- Hardware error recovery -- Software detection and recovery.

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