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Physical principles of electron microscopy：an introduction to TEM, SEM, and AEM

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Bibliographic Details
Main Authors: Egerton R. F.
Published: Springer Science+Business Media,
Publisher Address: New York
Publication Dates: c2005.
Literature type: Book
Language: English
Subjects:
Microscopy, Electron.
Physics
Electronic books.
Electron microscopy.
Online Access: http://dx.doi.org/10.1007/b136495
Carrier Form: xii, 202 p.: ill. ; 25 cm.
ISBN: 0387260161 (electronic bk. : Adobe Reader)
9780387260167 (electronic bk. : Adobe Reader)
Index Number: TN16
CLC: TN16
Contents: Includes bibliographical references (p. [195]-196) and index.

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