Physical principles of electron microscopy:an introduction to TEM, SEM, and AEM
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Main Authors: | |
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Published: |
Springer Science+Business Media,
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Publisher Address: | New York |
Publication Dates: | c2005. |
Literature type: | Book |
Language: | English |
Subjects: | |
Online Access: |
http://dx.doi.org/10.1007/b136495 |
Carrier Form: | xii, 202 p.: ill. ; 25 cm. |
ISBN: |
0387260161 (electronic bk. : Adobe Reader) 9780387260167 (electronic bk. : Adobe Reader) |
Index Number: | TN16 |
CLC: | TN16 |
Contents: | Includes bibliographical references (p. [195]-196) and index. |