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Atomic force microscopy/scanning tunneling microscopy 2

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Bibliographic Details
Corporate Authors: U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy AFM/STM Symposium 1994 Natick, Mass.)
Group Author: Lightbody Marcia L; Cohen Samuel H
Published: Plenum Press,
Publisher Address: New York
Publication Dates: c1997.
Literature type: Book
Language: English
Subjects:
Scanning tunneling microscopy
Atomic force microscopy
Carrier Form: ix, 250 p.: ill. ; 26 cm.
ISBN: 030645596X
Index Number: TH742
CLC: TH742-532
TN16-532
Call Number: TN16-532/A881/1994/
Contents: "Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso.
Includes bibliographical references and index.

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