Atomic force microscopy/scanning tunneling microscopy 2
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Corporate Authors: | |
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Group Author: | ; |
Published: |
Plenum Press,
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Publisher Address: | New York |
Publication Dates: | c1997. |
Literature type: | Book |
Language: | English |
Subjects: | |
Carrier Form: | ix, 250 p.: ill. ; 26 cm. |
ISBN: | 030645596X |
Index Number: | TH742 |
CLC: |
TH742-532 TN16-532 |
Call Number: | TN16-532/A881/1994/ |
Contents: |
"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso. Includes bibliographical references and index. |