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Design, manufacturing, and testing of micro-and nano-optical devices and systems：5th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2010, Dalian, China

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Bibliographic Details
Corporate Authors: International Symposium on Advanced Optical Manufacturing and Testing Technologies (5th 2010 Dalian Shi, China; Society of Photo-Optical Instrumentation Engineers; Zhongguo ke xue yuan. Guang dian ji shu yan jiu suo; China. Guo jia ke xue ji shu bu; Fraunhofer Institute for Applied Optics and Precision Engineering; Zhongguo guang xue xue hui
Group Author: Ye Tianchun
Published: SPIE,
Publisher Address: Bellingham, WA
Publication Dates: c2010.
Literature type: Book
Language: English
Series: Proceedings of SPIE ; v. 7657
Subjects:
Optical instruments > Testing
Optoelectronic devices > Design and construction
Optoelectronic devices > Testing
Optical instruments > Design and construction
Carrier Form: 1 v. (various pagings): ill. ; 28 cm.
ISBN: 9780819480873
0819480878
Index Number: TH74
CLC: TH74-532
Call Number: TH74-532/I617/2010
Contents: Sponsored by COS--Chinese Optical Society (China) [and] IOE--the Institute of Optics and Electronics, CAS (China) ; supporting organizations, Ministry of Science and Technology of China ... [et al.]. ; cooperating organizations, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany) ... [et al.] ; supporting organization, National Natural Science Foundation (China) ; cosponsor and published by SPIE--the International Society for Optical Engineering.
Includes bibliographical references and index.

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