Quantum Metrology, Imaging, and Communication /

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by referen...

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Bibliographic Details
Main Authors: Simon, David S
Corporate Authors: SpringerLink Online service
Group Author: Jaeger, Gregg; Sergienko, Alexander V
Published: Springer International Publishing : Imprint: Springer,
Publisher Address: Cham :
Publication Dates: 2017.
Literature type: eBook
Language: English
Series: Quantum Science and Technology,
Subjects:
Online Access: http://dx.doi.org/10.1007/978-3-319-46551-7
Summary: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Carrier Form: 1 online resource (XII, 273 pages) : illustrations.
ISBN: 9783319465517
Index Number: QC173
CLC: O431.2
Contents: Quantum Optics and Entanglement -- Two-Photon Interference- Aberration and Dispersion Cancelation -- Quantum Metrology -- Polarization Mode Dispersion -- Ghost Imaging and Related Topics -- Quantum Microscopy -- Correlated and Entangled Orbital Angular Momentum -- Quantum Communication and Cryptography -- Appendices A: Review of Optics -- B: Optical Fields in Quantum Mechanics -- C: Optical Effects of Aberration and Turbulence -- D: Phase Matching in Spontaneous Parametric Down Conversion -- E: Vectorial Scattering Analysis of the Twin-Photon Microscope.